Quasiballistic transport in nanometer Si metal-oxide-semiconductor field-effect transistors: Experimental and Monte Carlo analysis
- Łusakowski, J.
- Martínez, M.J.M.
- Rengel, R.
- González, T.
- Tauk, R.
- Meziani, Y.M.
- Knap, W.
- Boeuf, F.
- Skotnicki, T.
Zeitschrift:
Journal of Applied Physics
ISSN: 0021-8979
Datum der Publikation: 2007
Ausgabe: 101
Nummer: 11
Art: Artikel