Quasiballistic transport in nanometer Si metal-oxide-semiconductor field-effect transistors: Experimental and Monte Carlo analysis

  1. Łusakowski, J.
  2. Martínez, M.J.M.
  3. Rengel, R.
  4. González, T.
  5. Tauk, R.
  6. Meziani, Y.M.
  7. Knap, W.
  8. Boeuf, F.
  9. Skotnicki, T.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2007

Volume: 101

Issue: 11

Type: Article

DOI: 10.1063/1.2739307 GOOGLE SCHOLAR