Comparison between the noise performance of double- and single-gate InP-based HEMTs
- Vasallo, B.G.
- Wichmann, N.
- Bollaert, S.
- Roelens, Y.
- Cappy, A.
- González, T.
- Pardo, D.
- Mateos, J.
ISSN: 0018-9383
Année de publication: 2008
Volumen: 55
Número: 6
Pages: 1535-1540
Type: Article