Detection of terahertz radiation using submicron field effect transistors and their use for inspection applications

  1. Delgado Notario, J.A.
  2. Javadi, E.
  3. Velázquez, J.E.
  4. Diez, E.
  5. Meziani, Y.M.
  6. Fobelets, K.
Actes:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X 0277-786X

ISBN: 9781510613423

Any de publicació: 2017

Volum: 10439

Tipus: Aportació congrés

DOI: 10.1117/12.2278208 GOOGLE SCHOLAR