Detection of terahertz radiation using submicron field effect transistors and their use for inspection applications

  1. Delgado Notario, J.A.
  2. Javadi, E.
  3. Velázquez, J.E.
  4. Diez, E.
  5. Meziani, Y.M.
  6. Fobelets, K.
Actes de conférence:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X 0277-786X

ISBN: 9781510613423

Année de publication: 2017

Volumen: 10439

Type: Communication dans un congrès

DOI: 10.1117/12.2278208 GOOGLE SCHOLAR