Detection of terahertz radiation using submicron field effect transistors and their use for inspection applications

  1. Delgado Notario, J.A.
  2. Javadi, E.
  3. Velázquez, J.E.
  4. Diez, E.
  5. Meziani, Y.M.
  6. Fobelets, K.
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X 0277-786X

ISBN: 9781510613423

Year of publication: 2017

Volume: 10439

Type: Conference paper

DOI: 10.1117/12.2278208 GOOGLE SCHOLAR