Publikationen, an denen er mitarbeitet Viktoras Gruzinskis (25)

2006

  1. Theoretical investigation of Schottky-barrier diode noise performance in external resonant circuits

    Semiconductor Science and Technology, Vol. 21, Núm. 4, pp. 550-557

2005

  1. Monte Carlo analysis of nano-scale schottky diodes for thz generation

    EUSPEN 2005 - Proceedings of the 5th International Conference of the European Society for Precision Engineering and Nanotechnology

  2. Non-linear noise in nanometric Schottky-barrier diodes

    AIP Conference Proceedings

  3. Theoretical investigation of large-signal noise in nanometric schottky-barrier diodes operating in external resonant circuits

    Acta Physica Polonica A

2003

  1. Microscopic investigation of large-signal noise in semiconductor materials and devices

    Proceedings of SPIE - The International Society for Optical Engineering

  2. Monte Carlo Simulation of Electronic Noise in Semiconductor Materials and Devices Operating under Cyclostationary Conditions

    Journal of Computational Electronics, Vol. 2, Núm. 2-4, pp. 455-458

  3. Monte Carlo simulation of threshold bandwidth for high-order harmonic extraction

    IEEE Transactions on Electron Devices, Vol. 50, Núm. 5, pp. 1171-1178

  4. Upconversion of partition noise in semiconductors operating under periodic large-signal conditions

    Physical Review B - Condensed Matter and Materials Physics, Vol. 67, Núm. 16

2001

  1. Transfer-field methods for electronic noise in submicron semiconductor structures

    Rivista del Nuovo Cimento, Vol. 24, Núm. 9, pp. 1-72

2000

  1. Langevin forces and generalized transfer fields for noise modeling in deep submicron devices

    IEEE Transactions on Electron Devices, Vol. 47, Núm. 10, pp. 1992-1998

1998

  1. Transfer impedance calculations of electronic noise in two-terminal semiconductor structures

    Journal of Applied Physics, Vol. 83, Núm. 4, pp. 2052-2066

1997

  1. Microscopic description of diffusion noise sources

    Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

  2. Monte Carlo analysis of electronic noise in semiconductor materials and devices

    Microelectronics Journal, Vol. 28, Núm. 2, pp. 183-198