Physically based comparison of current noise analysis of Si BJT's and SiGe HBT's

  1. Martin-Martinez, M.J.
  2. Pardo, D.
Aktak:
European Solid-State Device Research Conference

ISSN: 1930-8876

ISBN: 9782863322482

Argitalpen urtea: 2000

Orrialdeak: 148-151

Mota: Biltzar ekarpena

DOI: 10.1109/ESSDERC.2000.194736 GOOGLE SCHOLAR
Datuen iturria: Scopus