Monte Carlo analysis of voltage noise in sub-micrometre semiconductor structures under large-signal regime

  1. Pérez, S.
  2. González, T.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242

Year of publication: 2002

Volume: 17

Issue: 7

Pages: 696-700

Type: Article

DOI: 10.1088/0268-1242/17/7/311 GOOGLE SCHOLAR
Data source: Scopus