Monte Carlo analysis of voltage noise in sub-micrometre semiconductor structures under large-signal regime

  1. Pérez, S.
  2. González, T.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 0268-1242

Argitalpen urtea: 2002

Alea: 17

Zenbakia: 7

Orrialdeak: 696-700

Mota: Artikulua

DOI: 10.1088/0268-1242/17/7/311 GOOGLE SCHOLAR
Datuen iturria: Scopus