Monte Carlo analysis of voltage noise in sub-micrometre semiconductor structures under large-signal regime

  1. Pérez, S.
  2. González, T.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 2002

Volumen: 17

Número: 7

Pages: 696-700

Type: Article

DOI: 10.1088/0268-1242/17/7/311 GOOGLE SCHOLAR
La source de données: Scopus