3D Monte Carlo analysis of discrete dopant effects on electron noise in Si devices
- Dollfus, P.
- Velázquez, J.E.
- Bournel, A.
- Galdin-Retailleau, S.
ISSN: 1569-8025
Year of publication: 2004
Volume: 3
Issue: 3-4
Pages: 311-315
Type: Article
ISSN: 1569-8025
Year of publication: 2004
Volume: 3
Issue: 3-4
Pages: 311-315
Type: Article