On the high-frequency noise figures of merit and microscopic channel noise sources in fabricated 90 nm PD SOI MOSFETs

  1. Rengel, R.
  2. Martín, M.J.
  3. Pailloncy, G.
  4. Dambrine, G.
  5. Danneville, F.
Proceedings:
AIP Conference Proceedings

ISSN: 0094-243X,  1551-7616

ISBN: 9780735402676

Year of publication: 2005

Volume: 780

Pages: 745-748

Type: Conference paper

DOI: 10.1063/1.2036857 GOOGLE SCHOLAR
Data source: Scopus