Numerical and experimental analysis of the static characteristics and noise in ungated recessed MESFET structures

  1. Mateos, J.
  2. González, T.
  3. Pardo, D.
  4. Tadyszak, P.
  5. Danneville, F.
  6. Cappy, A.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 1996

Volume: 39

Issue: 11

Pages: 1629-1636

Type: Article

DOI: 10.1016/0038-1101(96)00083-4 GOOGLE SCHOLAR
Data source: Scopus