Numerical and experimental analysis of the static characteristics and noise in ungated recessed MESFET structures

  1. Mateos, J.
  2. González, T.
  3. Pardo, D.
  4. Tadyszak, P.
  5. Danneville, F.
  6. Cappy, A.
Aldizkaria:
Solid-State Electronics

ISSN: 0038-1101

Argitalpen urtea: 1996

Alea: 39

Zenbakia: 11

Orrialdeak: 1629-1636

Mota: Artikulua

DOI: 10.1016/0038-1101(96)00083-4 GOOGLE SCHOLAR
Datuen iturria: Scopus