Numerical and experimental analysis of the static characteristics and noise in ungated recessed MESFET structures

  1. Mateos, J.
  2. González, T.
  3. Pardo, D.
  4. Tadyszak, P.
  5. Danneville, F.
  6. Cappy, A.
Revue:
Solid-State Electronics

ISSN: 0038-1101

Année de publication: 1996

Volumen: 39

Número: 11

Pages: 1629-1636

Type: Article

DOI: 10.1016/0038-1101(96)00083-4 GOOGLE SCHOLAR
La source de données: Scopus