Monte Carlo analysis of dynamic and noise performance of submicron MOSFETs at RF and microwave frequencies

  1. Rengel, R.
  2. Mateos, J.
  3. Pardo, D.
  4. González, T.
  5. Martín, M.J.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242

Year of publication: 2001

Volume: 16

Issue: 11

Pages: 939-946

Type: Article

DOI: 10.1088/0268-1242/16/11/310 GOOGLE SCHOLAR
Data source: Scopus