Monte Carlo analysis of dynamic and noise performance of submicron MOSFETs at RF and microwave frequencies

  1. Rengel, R.
  2. Mateos, J.
  3. Pardo, D.
  4. González, T.
  5. Martín, M.J.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 2001

Volumen: 16

Número: 11

Pages: 939-946

Type: Article

DOI: 10.1088/0268-1242/16/11/310 GOOGLE SCHOLAR
La source de données: Scopus