Monte Carlo analysis of dynamic and noise performance of submicron MOSFETs at RF and microwave frequencies

  1. Rengel, R.
  2. Mateos, J.
  3. Pardo, D.
  4. González, T.
  5. Martín, M.J.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 0268-1242

Argitalpen urtea: 2001

Alea: 16

Zenbakia: 11

Orrialdeak: 939-946

Mota: Artikulua

DOI: 10.1088/0268-1242/16/11/310 GOOGLE SCHOLAR