A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs

  1. Rengel, R.
  2. Martin, M.J.
  3. González, T.
  4. Mateos, J.
  5. Pardo, D.
  6. Dambrine, G.
  7. Raskin, J.-P.
  8. Danneville, F.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2006

Volume: 53

Issue: 3

Pages: 523-532

Type: Article

DOI: 10.1109/TED.2005.863541 GOOGLE SCHOLAR
Data source: Scopus