Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures

  1. Varani, L.
  2. Reggiani, L.
  3. Houlet, P.
  4. Vaissiere, J.C.
  5. Nougier, J.P.
  6. Kuhn, T.
  7. Gonzalez, T.
  8. Pardo, D.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242

Year of publication: 1994

Volume: 9

Issue: 5 S

Pages: 584-587

Type: Article

DOI: 10.1088/0268-1242/9/5S/050 GOOGLE SCHOLAR
Data source: Scopus