Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures

  1. Varani, L.
  2. Reggiani, L.
  3. Houlet, P.
  4. Vaissiere, J.C.
  5. Nougier, J.P.
  6. Kuhn, T.
  7. Gonzalez, T.
  8. Pardo, D.
Revue:
Semiconductor Science and Technology

ISSN: 0268-1242

Année de publication: 1994

Volumen: 9

Número: 5 S

Pages: 584-587

Type: Article

DOI: 10.1088/0268-1242/9/5S/050 GOOGLE SCHOLAR
La source de données: Scopus