Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures

  1. Varani, L.
  2. Reggiani, L.
  3. Houlet, P.
  4. Vaissiere, J.C.
  5. Nougier, J.P.
  6. Kuhn, T.
  7. Gonzalez, T.
  8. Pardo, D.
Aldizkaria:
Semiconductor Science and Technology

ISSN: 0268-1242

Argitalpen urtea: 1994

Alea: 9

Zenbakia: 5 S

Orrialdeak: 584-587

Mota: Artikulua

DOI: 10.1088/0268-1242/9/5S/050 GOOGLE SCHOLAR
Datuen iturria: Scopus