Publicaciones en las que colabora con Philippe Dollfus (7)

2006

  1. Sensitivity of single-and double-gate MOS architectures to residual discrete dopant distribution in the channel

    Journal of Computational Electronics, Vol. 5, Núm. 2-3, pp. 119-123

  2. Thermal noise in nanometric DG-MOSFET

    Journal of Computational Electronics, Vol. 5, Núm. 4, pp. 479-482

2005

  1. 3D Monte Carlo study of thermal noise in DG-MOSFET

    AIP Conference Proceedings

2004

  1. 3D Monte Carlo analysis of discrete dopant effects on electron noise in Si devices

    Journal of Computational Electronics, Vol. 3, Núm. 3-4, pp. 311-315

  2. 3D monte carlo analysis of discrete dopant effects on electron noise in Si devices

    2004 10th International Workshop on Computational Electronics, IEEE IWCE-10 2004, Abstracts

2001

  1. An ionised-impurity scattering model for 3D Monte Carlo device simulation with discrete impurity distribution

    VLSI Design

2000

  1. Monte Carlo study of sub-0.1 μm Si0.97C0.03/Si MODFET: electron transport and device performance

    IEEE Transactions on Electron Devices, Vol. 47, Núm. 6, pp. 1247-1250